標題: Group testing in bipartite graphs
作者: Juan, ST
Chang, GJ
應用數學系
Department of Applied Mathematics
關鍵字: group testing;algorithm;complete graph;bipartite graph;induced subgraph
公開日期: 1-三月-2002
摘要: This paper investigates the group testing problem in graphs as follows. Given a graph G = (V, E), determine the minimum number t(G) such that t(G) tests are sufficient to identify an unknown edge e with each test specifies a subset X subset of or equal to V and answers whether the unknown edge e is in G[X] or not. Damaschke proved that [log(2) e(G)] less than or equal to t(G) less than or equal to [log(2) e(G)] + 1 for any graph G, where e(G) is the number of edges of G. While there are infinitely many complete graphs that attain the upper bound, it was conjectured by Chang and Hwang that the lower bound is attained by all bipartite graphs. This paper verifies the conjecture for bipartite graphs G with e(G) less than or equal to 2(4) or 2(k-1) < e(G) less than or equal to 2(k-1) + 2(k-3) + 2(k-6) + 19(.)2(k-7/2) -1 for k greater than or equal to 5.
URI: http://hdl.handle.net/11536/28989
ISSN: 1027-5487
期刊: TAIWANESE JOURNAL OF MATHEMATICS
Volume: 6
Issue: 1
起始頁: 67
結束頁: 73
顯示於類別:期刊論文