完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chao, CW | en_US |
dc.contributor.author | Hu, GR | en_US |
dc.contributor.author | Wu, YS | en_US |
dc.contributor.author | Chen, YC | en_US |
dc.contributor.author | Feng, MS | en_US |
dc.date.accessioned | 2014-12-08T15:42:48Z | - |
dc.date.available | 2014-12-08T15:42:48Z | - |
dc.date.issued | 2002-02-01 | en_US |
dc.identifier.issn | 1099-0062 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1149/1.1435562 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/29021 | - |
dc.description.abstract | Electrochemically deposited Pd-induced crystallization of prepatterned amorphous silicon (a-Si) thin films was proposed for the first time in this study. Most of palladium clusters were found to deposit on the sidewall of the amorphous-silicon islands. After samples were annealed at 530degreesC, parallel needlelike polycrystalline silicon grains were observed on the a-Si film with a constant angle of similar to55degrees from the edge. The direction of the primary grain growth was along [211] and the secondary growth occurred along [011] direction. (C) 2001 The Electrochemical Society. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Electrochemically deposited Pd-induced crystallization of parallel needlelike polycrystalline silicon from prepatterned amorphous silicon thin films | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1149/1.1435562 | en_US |
dc.identifier.journal | ELECTROCHEMICAL AND SOLID STATE LETTERS | en_US |
dc.citation.volume | 5 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.spage | C31 | en_US |
dc.citation.epage | C32 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000173246600009 | - |
dc.citation.woscount | 2 | - |
顯示於類別: | 期刊論文 |