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dc.contributor.authorChang, TFen_US
dc.contributor.authorChang, Len_US
dc.date.accessioned2014-12-08T15:43:10Z-
dc.date.available2014-12-08T15:43:10Z-
dc.date.issued2001-12-01en_US
dc.identifier.issn0884-2914en_US
dc.identifier.urihttp://hdl.handle.net/11536/29219-
dc.description.abstractDeposition of highly textured diamond films on Si(001) has been achieved by using positively bias-enhanced nucleation in microwave plasma chemical vapor deposition. During the biasing period, an additional glow discharge due to the dc plasma effect appeared between the electrode and the substrate. The discharge is necessary for enhanced nucleation of diamond. X-ray diffraction, scanning electron microscopy, and cross-sectional transmission electron microscopy (XTEM) were used to characterize the microstructure of the diamond films on Si. The results show the morphology of diamond grains in square shape with strong diamond (001) texture. XTEM reveals that an amorphous interlayer formed on the smooth Si surface before diamond nucleation.en_US
dc.language.isoen_USen_US
dc.titleHighly oriented diamond growth on positively biased Si substratesen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF MATERIALS RESEARCHen_US
dc.citation.volume16en_US
dc.citation.issue12en_US
dc.citation.spage3351en_US
dc.citation.epage3354en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000172585100006-
dc.citation.woscount1-
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