統計資料
總造訪次數
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|---|---|
| Improvements in both thermal stability of Ni-silicide and electrical reliability of gate oxides using a stacked polysilicon gate structure | 112 |
本月總瀏覽
| 八月 2025 | 九月 2025 | 十月 2025 | 十一月 2025 | 十二月 2025 | 一月 2026 | 二月 2026 | |
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| Improvements in both thermal stability of Ni-silicide and electrical reliability of gate oxides using a stacked polysilicon gate structure | 0 | 0 | 0 | 0 | 0 | 0 | 1 |
檔案下載
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| 000170813000055.pdf | 18 |
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