統計資料
總造訪次數
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| Improvements in both thermal stability of Ni-silicide and electrical reliability of gate oxides using a stacked polysilicon gate structure | 111 |
本月總瀏覽
| 七月 2024 | 八月 2024 | 九月 2024 | 十月 2024 | 十一月 2024 | 十二月 2024 | 一月 2025 | |
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| Improvements in both thermal stability of Ni-silicide and electrical reliability of gate oxides using a stacked polysilicon gate structure | 0 | 0 | 0 | 0 | 1 | 1 | 0 |
檔案下載
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| 000170813000055.pdf | 12 |
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