標題: Efficient computation of marginal reliability-importance for reducible(+) networks
作者: Hsu, SJ
Yuang, MC
資訊工程學系
Department of Computer Science
關鍵字: marginal reliability importance (MRI);network reduction technique;reducible network;terminal-pair reliability (TR)
公開日期: 1-三月-2001
摘要: Marginal reliability importance (MRI) of a link with respect to terminal-pair reliability (TR) is the rate to which TR changes with the modification of the success probability of the link. It is a quantitative measure reflecting the importance of the individual link in contributing to TR of a given network. Computing MRI for general networks is an NP-complete problem. Attention has been drawn to a particular set of networks (reducible networks), which can be simplified to source-sink (2-node) networks via 6 simple reduction rules (axioms). The computational complexity of the MRI problem for such networks is polynomial bounded. This paper proposes a new reduction rule, referred to as triangle reduction. The triangle reduction rule transforms a graph containing a triangle subgraph to that excluding the base of the triangle, with constant complexity. Networks which can be fully reduced to source-sink networks by the triangle reduction rule, in addition to the 6 reduction rules, are further defined as reducible(+) networks. For efficient computation of MRI for reducible(+) networks, a 2-phase (2-P) algorithm is given. The 2-P algorithm performs network reduction in phase 1. In each reduction step, the 2-P algorithm generates the correlation, quantified by a reduction factor, between the original network and the reduced network. In phase 2, the 2-P algorithm backtracks the reduction steps and computes MRI, based on the reduction factors generated in phase 1 and a set of closed-form TR formulas. As a result, the 2-P algorithm yields a linearly bounded complexity for the computation of MRI for reducible+ networks. Experimental results from real networks and benchmarks show the superiority, by two orders of magnitude, of the 2-P algorithm over the traditional approach.
URI: http://dx.doi.org/10.1109/24.935023
http://hdl.handle.net/11536/29790
ISSN: 0018-9529
DOI: 10.1109/24.935023
期刊: IEEE TRANSACTIONS ON RELIABILITY
Volume: 50
Issue: 1
起始頁: 98
結束頁: 106
顯示於類別:期刊論文


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