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dc.contributor.authorLu, YHen_US
dc.contributor.authorDimitrov, Den_US
dc.contributor.authorLiu, JRen_US
dc.contributor.authorHsieh, TEen_US
dc.contributor.authorShieh, HPDen_US
dc.date.accessioned2014-12-08T15:44:08Z-
dc.date.available2014-12-08T15:44:08Z-
dc.date.issued2001-03-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.40.1647en_US
dc.identifier.urihttp://hdl.handle.net/11536/29800-
dc.description.abstractTellurium was studied as a mask film in a thermally induced superresolution rewritable optical disk for detecting below-diffraction-limit marks. Mark trains of 0.15 mum could be retrieved with 9 dB in carrier-to-noise (CNR) using an optical system with the laser wavelength of 780 nm and an objective lens of 0.55 numerical aperture. Readout cyclability was examined and methods to further improve readout cyclability were proposed.en_US
dc.language.isoen_USen_US
dc.subjectgerasable phase changeen_US
dc.subjectmask filmsen_US
dc.subjectthermally induced superresolution readouten_US
dc.subjectcyclabilityen_US
dc.subjecttelluriumen_US
dc.titleMask films for thermally induced superresolution readout in rewritable phase-change optical disksen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1143/JJAP.40.1647en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERSen_US
dc.citation.volume40en_US
dc.citation.issue3Ben_US
dc.citation.spage1647en_US
dc.citation.epage1648en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000170771600031-
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