標題: Construction of a near-field spectrum analysis system using bent tapered fiber probes
作者: Chen, SH
Chen, YF
電子物理學系
Department of Electrophysics
公開日期: 1-一月-2001
摘要: We take advantage of a combination of laser heating and pulling and electric arc bending to fabricate bent tapered fiber probes. The bent angles can be varied from 30 degrees to 70 degrees and tip diameters fall within a few tens of nanometers. These bent fiber probes can easily be adapted into any dynamic mode atomic force microscope. By proper manipulation of the bent angles, a spatial resolution of up to 60 nm is achievable. After coating the bent fiber probes with a thin layer of Pt/Pd film by ion sputtering, the transmission efficiency is measured to be around 10(-5), which is applicable for near-field spectrum analysis experiment. (C) 2001 American Institute of Physics.
URI: http://dx.doi.org/10.1063/1.1327302
http://hdl.handle.net/11536/29912
ISSN: 0034-6748
DOI: 10.1063/1.1327302
期刊: REVIEW OF SCIENTIFIC INSTRUMENTS
Volume: 72
Issue: 1
起始頁: 268
結束頁: 270
顯示於類別:期刊論文


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