THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY

Full metadata record

DC Field	Value	Language
dc.contributor.author	CHAO, TS	en_US
dc.contributor.author	LEE, CL	en_US
dc.contributor.author	LEI, TF	en_US
dc.date.accessioned	2014-12-08T15:04:31Z	-
dc.date.available	2014-12-08T15:04:31Z	-
dc.date.issued	1993-05-15	en_US
dc.identifier.issn	0261-8028	en_US
dc.identifier.uri	http://dx.doi.org/10.1007/BF00626698	en_US
dc.identifier.uri	http://hdl.handle.net/11536/3015	-
dc.language.iso	en_US	en_US
dc.title	THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1007/BF00626698	en_US
dc.identifier.journal	JOURNAL OF MATERIALS SCIENCE LETTERS	en_US
dc.citation.volume	12	en_US
dc.citation.issue	10	en_US
dc.citation.spage	721	en_US
dc.citation.epage	723	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1993LE39800011	-
dc.citation.woscount	2	-
Appears in Collections:	Articles