Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hsu, SY | en_US |
dc.contributor.author | Shen, FJ | en_US |
dc.contributor.author | Lin, JJ | en_US |
dc.date.accessioned | 2014-12-08T15:45:05Z | - |
dc.date.available | 2014-12-08T15:45:05Z | - |
dc.date.issued | 2000-07-01 | en_US |
dc.identifier.issn | 0921-4526 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/S0921-4526(99)02606-X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/30413 | - |
dc.description.abstract | We have successfully made a series of thick CuxGe100-x films spanning the weakly and strongly localized regimes. With decreasing mole concentration of Cu relative to Ge, the resistivity of film becomes bigger at a given temperature and demonstrates a stronger temperature dependence at low temperatures. When x is big, 46 less than or equal to x less than or equal to 56, resistivity increases with the square root of the decreasing temperature, implying a weak-disorder behavior. For x small, 14 less than or equal to x less than or equal to 2.0, resistivity increases exponentially with decreasing temperature, implying a strongly localized behavior. The results show that the low-temperature transport in these films is dominated by the disorder enhanced electron-electron interaction effects. (C) 2000 Elsevier Science B.V. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | disordered metals | en_US |
dc.subject | electron-electron interaction | en_US |
dc.subject | hopping | en_US |
dc.subject | quantum transport | en_US |
dc.title | Electron-electron interaction dominated quantum transport in thick CuGe films | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1016/S0921-4526(99)02606-X | en_US |
dc.identifier.journal | PHYSICA B | en_US |
dc.citation.volume | 284 | en_US |
dc.citation.issue | en_US | |
dc.citation.spage | 1181 | en_US |
dc.citation.epage | 1182 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | 物理研究所 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.contributor.department | Institute of Physics | en_US |
dc.identifier.wosnumber | WOS:000087423100030 | - |
Appears in Collections: | Conferences Paper |
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