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dc.contributor.authorSheu, CRen_US
dc.contributor.authorCheng, CYen_US
dc.contributor.authorWang, PSen_US
dc.contributor.authorLee, CYen_US
dc.contributor.authorPan, RPen_US
dc.date.accessioned2014-12-08T15:45:14Z-
dc.date.available2014-12-08T15:45:14Z-
dc.date.issued2000-06-01en_US
dc.identifier.issn0577-9073en_US
dc.identifier.urihttp://hdl.handle.net/11536/30483-
dc.description.abstractThe parallel-plate capacitor cells are used as model systems for studying the dielectric breakdown (DB) patterns. Air, a liquid crystal and several kinds of oils are used as the dielectric material sandwiched between the plates. We study the types of patterns formed with different materials, voltages and cell thickness. The fractal dimensions and the conditions for getting each type of DB pattern are obtained for the first time. In addition, the fractal dimensions of patterns simulated by using the active walker model (AWM) are also analyzed and compared with the experimental DB patterns.en_US
dc.language.isoen_USen_US
dc.titleAnalysis of dielectric breakdown patterns in parallel-plate capacitorsen_US
dc.typeArticleen_US
dc.identifier.journalCHINESE JOURNAL OF PHYSICSen_US
dc.citation.volume38en_US
dc.citation.issue3en_US
dc.citation.spage461en_US
dc.citation.epage470en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000087676900006-
dc.citation.woscount5-
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