完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chen, RP | en_US |
dc.contributor.author | Lin, DS | en_US |
dc.date.accessioned | 2014-12-08T15:45:16Z | - |
dc.date.available | 2014-12-08T15:45:16Z | - |
dc.date.issued | 2000-05-20 | en_US |
dc.identifier.issn | 0039-6028 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/S0039-6028(00)00199-0 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/30513 | - |
dc.description.abstract | Hydrogen recombinative desorption from a Si2H2 monohydride dimer on the Si(100) surface regenerates a dangling bond (DB) pair on the dimer. In this paper, we investigated the spatial distribution of the regenerated DB pairs on the Si(100)-2 x 1:H and disilane-passivated Si(100) surface using elevated temperature scanning tunneling microscopy (HT-STM) in the temperature range between 590 and 622 K. Experimental results indicate that the ends of one-dimensional (1D) monohydride dimer islands are preferred sites for DB pairs and a repulsive interaction occurs between two neighboring DB pairs in the same dimer row. (C) 2000 Elsevier Science B.V. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | hydrogen atom | en_US |
dc.subject | scanning tunneling microscopy | en_US |
dc.subject | silicon | en_US |
dc.subject | surface electronic phenomena (work function, surface potential, surface states, etc.) | en_US |
dc.subject | surface energy | en_US |
dc.subject | thermal desorption | en_US |
dc.title | Distribution of dangling bond pairs on partially hydrogen-terminated Si(100) surface observed by scanning tunneling microscopy | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1016/S0039-6028(00)00199-0 | en_US |
dc.identifier.journal | SURFACE SCIENCE | en_US |
dc.citation.volume | 454 | en_US |
dc.citation.issue | en_US | |
dc.citation.spage | 196 | en_US |
dc.citation.epage | 200 | en_US |
dc.contributor.department | 物理研究所 | zh_TW |
dc.contributor.department | Institute of Physics | en_US |
dc.identifier.wosnumber | WOS:000087766200040 | - |
顯示於類別: | 會議論文 |