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dc.contributor.authorChen, RPen_US
dc.contributor.authorLin, DSen_US
dc.date.accessioned2014-12-08T15:45:16Z-
dc.date.available2014-12-08T15:45:16Z-
dc.date.issued2000-05-20en_US
dc.identifier.issn0039-6028en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0039-6028(00)00199-0en_US
dc.identifier.urihttp://hdl.handle.net/11536/30513-
dc.description.abstractHydrogen recombinative desorption from a Si2H2 monohydride dimer on the Si(100) surface regenerates a dangling bond (DB) pair on the dimer. In this paper, we investigated the spatial distribution of the regenerated DB pairs on the Si(100)-2 x 1:H and disilane-passivated Si(100) surface using elevated temperature scanning tunneling microscopy (HT-STM) in the temperature range between 590 and 622 K. Experimental results indicate that the ends of one-dimensional (1D) monohydride dimer islands are preferred sites for DB pairs and a repulsive interaction occurs between two neighboring DB pairs in the same dimer row. (C) 2000 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjecthydrogen atomen_US
dc.subjectscanning tunneling microscopyen_US
dc.subjectsiliconen_US
dc.subjectsurface electronic phenomena (work function, surface potential, surface states, etc.)en_US
dc.subjectsurface energyen_US
dc.subjectthermal desorptionen_US
dc.titleDistribution of dangling bond pairs on partially hydrogen-terminated Si(100) surface observed by scanning tunneling microscopyen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/S0039-6028(00)00199-0en_US
dc.identifier.journalSURFACE SCIENCEen_US
dc.citation.volume454en_US
dc.citation.issueen_US
dc.citation.spage196en_US
dc.citation.epage200en_US
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentInstitute of Physicsen_US
dc.identifier.wosnumberWOS:000087766200040-
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