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dc.contributor.authorLin, GRen_US
dc.contributor.authorPan, CLen_US
dc.date.accessioned2014-12-08T15:45:19Z-
dc.date.available2014-12-08T15:45:19Z-
dc.date.issued2000-05-01en_US
dc.identifier.issn0306-8919en_US
dc.identifier.urihttp://hdl.handle.net/11536/30541-
dc.description.abstractWe have investigated the ultrafast optical and optoelectronic characteristics of multi-energy proton-bombarded GaAs (GaAs:H+) material and devices in some detail. Photo-excited carrier lifetimes of GaAs:H+ were observed to be as low as 350 +/- 50 fs. Photoconductive switches (PCS) fabricated on GaAs:H+ were found to exhibit lower dark currents (15 nA at a bias of 10 V) and higher breakdown voltage (> 100 kV/cm) than PCS's fabricated on semi-insulating (S.I.) GaAs. The temporal response of the GaAs:H+ PCS was about 2 ps at full-wave half minimum. Optically excited terahertz (THz) radiation from GaAs:H+ was reported for the first time to our knowledge. The temporal response and spectral bandwidth of the emitted THz radiation were 0.7 ps and 1.25 THz, respectively. The field strength of the THz signal was about 20 mV/cm. From the THz data, we are able to deduce that the effective carrier mobility of GaAs:H+ was less than 1 cm(2)/V-sec.en_US
dc.language.isoen_USen_US
dc.subjectcarrier lifetimeen_US
dc.subjectelectro-optic samplingen_US
dc.subjectphotoconductoren_US
dc.subjectproton-bombarded GaAsen_US
dc.subjectTHz radiationen_US
dc.titleUltrafast response of multi-energy proton-bombarded GaAs photoconductorsen_US
dc.typeArticleen_US
dc.identifier.journalOPTICAL AND QUANTUM ELECTRONICSen_US
dc.citation.volume32en_US
dc.citation.issue4-5en_US
dc.citation.spage553en_US
dc.citation.epage571en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000087070200008-
dc.citation.woscount9-
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