Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chang, L | en_US |
dc.contributor.author | Yan, JE | en_US |
dc.contributor.author | Chen, FR | en_US |
dc.contributor.author | Kai, JJ | en_US |
dc.date.accessioned | 2014-12-08T15:45:24Z | - |
dc.date.available | 2014-12-08T15:45:24Z | - |
dc.date.issued | 2000-04-01 | en_US |
dc.identifier.issn | 0925-9635 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/S0925-9635(99)00333-7 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/30589 | - |
dc.description.abstract | Deposition of heteroepitaxial diamond on substrates of 6H-SiC single crystal by a d.c. voltage biased-enhanced microwave plasma chemical vapor deposition method has been attempted. Various concentrations of methane (CH4) up to 10% in hydrogen (H-2) was used to evaluate its effect on epitaxy. Characterization of cross-sectional transmission electron microscopy with electron energy loss spectroscopy shows that an interlayer can form between diamond 6H-SiC, depending on the CH4 concentration. With low CH4 concentration, diamond was directly nucleated on 6H-SiC with an orientation relationship of diamond {111}//6H-SiC {0001} and diamond [110]//6H-SiC [11 (2) over bar 0]. (C) 2000 Elsevier Science S.A. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | bias | en_US |
dc.subject | heteroepitaxy | en_US |
dc.subject | silicon carbide | en_US |
dc.subject | transmission electron microscopy | en_US |
dc.title | Deposition of heteroepitaxial diamond on 6H-SiC single crystal by bias-enhanced microwave plasma chemical vapor deposition | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1016/S0925-9635(99)00333-7 | en_US |
dc.identifier.journal | DIAMOND AND RELATED MATERIALS | en_US |
dc.citation.volume | 9 | en_US |
dc.citation.issue | 3-6 | en_US |
dc.citation.spage | 283 | en_US |
dc.citation.epage | 289 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000087382400011 | - |
Appears in Collections: | Conferences Paper |
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