完整後設資料紀錄
DC 欄位語言
dc.contributor.authorCHEN, HRen_US
dc.contributor.authorCHANG, CYen_US
dc.contributor.authorTSAI, KLen_US
dc.contributor.authorTSANG, JSen_US
dc.contributor.authorLEE, CPen_US
dc.date.accessioned2014-12-08T15:04:34Z-
dc.date.available2014-12-08T15:04:34Z-
dc.date.issued1993-04-01en_US
dc.identifier.issn0038-1101en_US
dc.identifier.urihttp://hdl.handle.net/11536/3066-
dc.description.abstractTwo-stage molecular beam epitaxy (MBE) growth was employed to fabricate AlGaAs/GaAs heterojunction bipolar transistors (HBTs) for the first time. Due to the unique base contact layer design, the base can be made very thin without increasing the extrinsic base sheet resistance and the etching of the base contact can be done very easily and very reliably. In addition, the base-collector separation layer design contributed to the reduction of parasitic capacitance. D.C. differential current gains up to 110 and 200 were obtained for 1000 and 500 angstrom base width, respectively.en_US
dc.language.isoen_USen_US
dc.titleNOVEL ALGAAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS FABRICATED BY 2-STAGE MOLECULAR-BEAM EPITAXYen_US
dc.typeArticleen_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.citation.volume36en_US
dc.citation.issue4en_US
dc.citation.spage485en_US
dc.citation.epage487en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1993KU29400001-
dc.citation.woscount0-
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