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dc.contributor.authorChen, JFen_US
dc.contributor.authorChen, NCen_US
dc.contributor.authorWang, JSen_US
dc.contributor.authorWang, PYen_US
dc.date.accessioned2014-12-08T15:45:39Z-
dc.date.available2014-12-08T15:45:39Z-
dc.date.issued2000-03-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.39.1102en_US
dc.identifier.urihttp://hdl.handle.net/11536/30708-
dc.description.abstractCapacitance dispersion over frequency is investigated for relaxed In0.2Ga0.8As/GaAs Schottky diodes. While the high-frequency capacitance is voltage-independent, the low-frequency capacitance is seen to decrease with reverse voltage. Based on a Schottky barrier combined with a high-resistance layer containing traps, a simplified equation for the differential capacitance is derived to explain the capacitance-voltage-frequency relation. It is found that the high-frequency capacitance corresponds to the total thickness of the Schottky depletion and the high-resistance layer, while the low-frequency capacitance at a small reverse voltage is the Schottky depletion capacitance and at a large reverse voltage is the high-frequency capacitance.en_US
dc.language.isoen_USen_US
dc.subjectIn0.2Ga0.8As/GaAs Schottky diodesen_US
dc.subjectcapacitance dispersionen_US
dc.subjectdeep trapsen_US
dc.titleVoltage and frequency dependence of differential capacitance in relaxed In0.2Ga0.8As/GaAs Schottky diodesen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.39.1102en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERSen_US
dc.citation.volume39en_US
dc.citation.issue3Aen_US
dc.citation.spage1102en_US
dc.citation.epage1103en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000086705600024-
dc.citation.woscount0-
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