Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film

doi:10.1016/S0304-8853(99)00703-9

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Lin, HN	en_US
dc.contributor.author	Chang, CR	en_US
dc.contributor.author	Chiou, YH	en_US
dc.date.accessioned	2014-12-08T15:45:44Z	-
dc.date.available	2014-12-08T15:45:44Z	-
dc.date.issued	2000-02-01	en_US
dc.identifier.issn	0304-8853	en_US
dc.identifier.uri	http://dx.doi.org/10.1016/S0304-8853(99)00703-9	en_US
dc.identifier.uri	http://hdl.handle.net/11536/30763	-
dc.description.abstract	An unusual orthogonal magnetic structure is observed on a cobalt film by magnetic force microscopy. The structure is composed of a double wall, which is caused by a surface scratch, and two perpendicular spike domains, which are caused by an internal defect. The occurrence of the structure is attributed to the generation of surface free poles due to film inhomogeneities and their redistribution to reduce the magnetostatic energy. The magnetization pattern has also been proposed to explain the observed magnetic force image. (C) 2000 Elsevier Science B.V. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.subject	magnetic force microscopy	en_US
dc.subject	double wall	en_US
dc.subject	spike domain	en_US
dc.subject	defects	en_US
dc.title	Magnetic force microscopy study of a defect-induced orthogonal magnetic structure on a cobalt film	en_US
dc.type	Article; Proceedings Paper	en_US
dc.identifier.doi	10.1016/S0304-8853(99)00703-9	en_US
dc.identifier.journal	JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS	en_US
dc.citation.volume	209	en_US
dc.citation.issue	1-3	en_US
dc.citation.spage	243	en_US
dc.citation.epage	245	en_US
dc.contributor.department	電子物理學系	zh_TW
dc.contributor.department	Department of Electrophysics	en_US
dc.identifier.wosnumber	WOS:000085022700069	-
顯示於類別：	會議論文

文件中的檔案：

000085022700069.pdf

若為 zip 檔案，請下載檔案解壓縮後，用瀏覽器開啟資料夾中的 index.html 瀏覽全文。