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dc.contributor.authorJuang, JYen_US
dc.contributor.authorHsieh, MCen_US
dc.contributor.authorLuo, CWen_US
dc.contributor.authorUen, TMen_US
dc.contributor.authorWu, KHen_US
dc.contributor.authorGou, YSen_US
dc.date.accessioned2014-12-08T15:45:51Z-
dc.date.available2014-12-08T15:45:51Z-
dc.date.issued2000-01-01en_US
dc.identifier.issn0921-4534en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0921-4534(99)00566-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/30830-
dc.description.abstractThe fluctuation-induced conductivity (Delta sigma(T)) near T-c of a sole YBa2Cu3Ox (YBCO) film with various precisely controlled oxygen contents (6.5 less than or equal to x less than or equal to 6.95) was studied and compared with those obtained from its Tl-based counterparts. For YBCO films with x > 6.7, Delta sigma (T) displays a distinct 3D to 2D crossover as the temperature approaches T-c. On the other hand, as T -->T-c, Delta sigma (T) of both Tl-based and YBCO film with x less than or equal to 6.7 exhibits a reversed 2D to 3D crossover. It is suggestive that the coupling between the CuO2 layers may have changed significantly with reducing oxygen. (C) 2000 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectfluctuation effectsen_US
dc.subjectoxygen stoichiometryen_US
dc.subjectCu-chainsen_US
dc.subjectcoherence lengthen_US
dc.titleFluctuation-enhanced conductivity in YBa2Cu2Ox (6.5 <= x <= 6.95) and Tl2Ba2Ca2Cu3O10 +/-deltaen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0921-4534(99)00566-3en_US
dc.identifier.journalPHYSICA Cen_US
dc.citation.volume329en_US
dc.citation.issue1en_US
dc.citation.spage45en_US
dc.citation.epage50en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000084672700007-
dc.citation.woscount19-
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