完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Kuo, WK | en_US |
dc.contributor.author | Huang, YT | en_US |
dc.contributor.author | Huang, SL | en_US |
dc.date.accessioned | 2014-12-08T15:46:03Z | - |
dc.date.available | 2014-12-08T15:46:03Z | - |
dc.date.issued | 1999-11-15 | en_US |
dc.identifier.issn | 0146-9592 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/30968 | - |
dc.description.abstract | A new technique for three-dimensional (3D) electric-field (e-field) vector measurement is presented. Three laser beams with different propagation paths in an electro-optic (EO) crystal were used to resolve 3D components of e-field vectors. We adopted a special geometric shape of bismuth silicon oxide EO crystal so that the three beams would propagate within it. A sensitivity of 0.6 V/cm root Hz was achieved. A commercial Ansoft Maxwell 3D field simulator was also used to verify our measurements. (C) 1999 Optical Society of America. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Three-dimensional electric-field vector measurement with an electro-optic sensing technique | en_US |
dc.type | Article | en_US |
dc.identifier.journal | OPTICS LETTERS | en_US |
dc.citation.volume | 24 | en_US |
dc.citation.issue | 22 | en_US |
dc.citation.spage | 1546 | en_US |
dc.citation.epage | 1548 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000083745900002 | - |
dc.citation.woscount | 9 | - |
顯示於類別: | 期刊論文 |