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dc.contributor.authorKuo, YFen_US
dc.contributor.authorTseng, TYen_US
dc.date.accessioned2014-12-08T15:46:04Z-
dc.date.available2014-12-08T15:46:04Z-
dc.date.issued1999-11-01en_US
dc.identifier.issn0254-0584en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0254-0584(99)00157-1en_US
dc.identifier.urihttp://hdl.handle.net/11536/30977-
dc.description.abstractPolycrystalline thin films of Ba0.7Sr0.3TiO3 (BST) are deposited on SiO2/Si substrates by radio frequency magnetron sputtering. This work also examines how the O-2 atmosphere annealing temperature affects not only the crystalline and morphological properties, but also the refractive index and the optical band gap energy. The BST films possess the highest dense packing growth and near-bulk optical properties as the O-2 atmosphere annealing temperature increases. Analysis results indicate that the packing density and the refractive index of BST films increase as the annealing temperature increases, whereas the optical band gap energies apparently decreased. In addition, the dispersion of the refractive index is analyzed in terms of dispersion parameters using the single oscillator dispersion model of Wemple and DiDomentico. (C) 1999 Elsevier Science S.A. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectBSTen_US
dc.subjectthin filmen_US
dc.subjectannealingen_US
dc.subjectoptical propertiesen_US
dc.titleStructure-related optical properties of rapid thermally annealed Ba0.7Sr0.3TiO3 thin filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0254-0584(99)00157-1en_US
dc.identifier.journalMATERIALS CHEMISTRY AND PHYSICSen_US
dc.citation.volume61en_US
dc.citation.issue3en_US
dc.citation.spage244en_US
dc.citation.epage250en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000082887500010-
dc.citation.woscount14-
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