完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChiu, MHen_US
dc.contributor.authorLee, JYen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2014-12-08T15:46:24Z-
dc.date.available2014-12-08T15:46:24Z-
dc.date.issued1999-07-01en_US
dc.identifier.issn0003-6935en_US
dc.identifier.urihttp://hdl.handle.net/11536/31224-
dc.description.abstractThe phase difference between s and p polarization of the light reflected from a material is used for measuring the material's complex refractive index. First, two phase differences that correspond to two different incidence angles are measured by heterodyne interferometry. Then these two phase differences are substituted into Fresnel's equations, and a set of simultaneous equations is obtained. Finally, the equations are solved by use of a personal computer by a numerical analysis technique, and the complex refractive index of the material can be estimated. (C) 1999 Optical Society of America.en_US
dc.language.isoen_USen_US
dc.titleComplex refractive-index measurement based on Fresnel's equations and the uses of heterodyne interferometryen_US
dc.typeArticleen_US
dc.identifier.journalAPPLIED OPTICSen_US
dc.citation.volume38en_US
dc.citation.issue19en_US
dc.citation.spage4047en_US
dc.citation.epage4052en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000081208400009-
dc.citation.woscount56-
顯示於類別:期刊論文


文件中的檔案:

  1. 000081208400009.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。