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dc.contributor.authorLin, CTen_US
dc.contributor.authorJuang, CFen_US
dc.contributor.authorHuang, JCen_US
dc.date.accessioned2014-12-08T15:46:44Z-
dc.date.available2014-12-08T15:46:44Z-
dc.date.issued1999-04-01en_US
dc.identifier.issn0165-0114en_US
dc.identifier.urihttp://hdl.handle.net/11536/31428-
dc.description.abstractTemperature control of a rapid thermal processing (RTP) system using a proposed self-constructing adaptive fuzzy inference network (SCAFIN) is presented in this paper. First, the physical modeling of a RTP system is done. An integrated model is given for the components that make up a RTP system. These components are the lamp power dynamics, ray-tracing model, and the wafer thermal dynamic model. The models for the components are integrated in a numerical code to give a computer simulation of the complete RTP system. The simulation can be used to investigate the interaction of the furnace, lamp contour, and the control system. Then a direct inverse control scheme using the proposed SCAFIN is adopted to control the temperature of the RTP system. The SCAFIN is inherently a modified TSK-type fuzzy rule-based model possessing neural network's learning ability. There are no rules initially in the SCAFIN. They are created and adapted as on-line learning proceeds via simultaneous structure and parameter identification. Simulation results show that the control approach is able to track a temporally varying temperature trajectory and maintain the uniformity of the spatial temperature distribution of the wafer in the RTP system simultaneously. (C) 1999 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectfuzzy systemen_US
dc.subjectadaptive fuzzy networken_US
dc.subjectstructure/parameter learningen_US
dc.subjectrapid thermal processen_US
dc.subjectdirect inverse controlen_US
dc.titleTemperature control of rapid thermal processing system using adaptive fuzzy networken_US
dc.typeArticleen_US
dc.identifier.journalFUZZY SETS AND SYSTEMSen_US
dc.citation.volume103en_US
dc.citation.issue1en_US
dc.citation.spage49en_US
dc.citation.epage65en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000078726700004-
dc.citation.woscount9-
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