完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLing, H. S.en_US
dc.contributor.authorWang, S. Y.en_US
dc.contributor.authorLee, C. P.en_US
dc.date.accessioned2014-12-08T15:47:18Z-
dc.date.available2014-12-08T15:47:18Z-
dc.date.issued2011-05-01en_US
dc.identifier.issn1350-4495en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.infrared.2010.12.020en_US
dc.identifier.urihttp://hdl.handle.net/11536/31731-
dc.description.abstractLong-wavelength InAs QDIPs with different thicknesses of InGaAs cap layer in the confinement-enhanced dots-in-a-well (CE-DWELL) structure were investigated. The sample with 3 nm cap layer shows primarily single band detection at 7 mu m that stems from the transition between QD states, but the 5 nm and 7 nm samples reveal voltage-tunable dual band detection in the region of 6-11 mu m from transitions to the states in the dots as well as the states in the well. The wavefunction coupling of transition states is effectively modified by the change of cap-layer thickness and the bias polarity, which leads to the observed spectral change and demonstrates the flexibility of the CE-DWELL QDIPs. For higher peak quantum efficiency (QE), thin InGaAs cap layers are used to obtain focused absorption strength. With 3 nm cap layer in the CE-DWELL, a respectable QE of 7.23% is reached for 10-stack QDIPs with 7 mu m detection wavelength at 77K. and a high detectivity of 3.4 x 10(10) Jones is also obtained. (C) 2010 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectQuantum doten_US
dc.subjectIntersubbanden_US
dc.subjectInfrared detectoren_US
dc.titleSpectral response and device performance tuning of long-wavelength InAs QDIPsen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.infrared.2010.12.020en_US
dc.identifier.journalINFRARED PHYSICS & TECHNOLOGYen_US
dc.citation.volume54en_US
dc.citation.issue3en_US
dc.citation.spage233en_US
dc.citation.epage236en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000290973200017-
顯示於類別:會議論文


文件中的檔案:

  1. 000290973200017.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。