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dc.contributor.authorHuang, JDen_US
dc.contributor.authorJou, JYen_US
dc.contributor.authorShen, WZen_US
dc.contributor.authorChuang, HHen_US
dc.date.accessioned2014-12-08T15:47:21Z-
dc.date.available2014-12-08T15:47:21Z-
dc.date.issued1998-12-01en_US
dc.identifier.issn1063-8210en_US
dc.identifier.urihttp://dx.doi.org/10.1109/92.736137en_US
dc.identifier.urihttp://hdl.handle.net/11536/31741-
dc.description.abstractIn this paper, we propose an iterative area/delay tradeoff algorithm to solve the circuit clustering problem under the capacity constraint. It first finds an initial delay-considered area-optimized clustering solution by a delay-oriented depth-first-search procedure. Then, an iterative procedure consisting of several reclustering techniques is applied to gradually trade the area for the performance. We then show that this algorithm can be easily extended to solve the clustering problem subject to both capacity and pin constraints. Experimental results show that our algorithm can provide a complete set of clustering solutions from the area-optimized one to the delay-optimized one for a given circuit. Furthermore, comparing to the existing delay-optimized algorithms, ours achieves almost the same performance but with much less area overhead. Therefore, this algorithm is very useful on solving the timing-driven circuit clustering problem.en_US
dc.language.isoen_USen_US
dc.subjectclusteringen_US
dc.subjectcritical pathen_US
dc.subjectdelayen_US
dc.subjectpartitioningen_US
dc.subjectperformanceen_US
dc.subjectperformance tradeoffsen_US
dc.titleOn circuit clustering for area/delay tradeoff under capacity and pin constraintsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/92.736137en_US
dc.identifier.journalIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSen_US
dc.citation.volume6en_US
dc.citation.issue4en_US
dc.citation.spage634en_US
dc.citation.epage642en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000077258400016-
dc.citation.woscount1-
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