統計資料
總造訪次數
| 檢視 | |
|---|---|
| Improvement of reliability of metal-oxide semiconductor field-effect transistors with N2O nitrided gate oxide and N2O polysilicon gate reoxidation | 109 |
本月總瀏覽
| 七月 2024 | 八月 2024 | 九月 2024 | 十月 2024 | 十一月 2024 | 十二月 2024 | 一月 2025 | |
|---|---|---|---|---|---|---|---|
| Improvement of reliability of metal-oxide semiconductor field-effect transistors with N2O nitrided gate oxide and N2O polysilicon gate reoxidation | 0 | 0 | 0 | 0 | 0 | 1 | 0 |
檔案下載
| 檢視 | |
|---|---|
| 000076630000016.pdf | 4 |
國家瀏覽排行
| 檢視 | |
|---|---|
| 中國 | 96 |
| 美國 | 12 |
| 台灣 | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 95 |
| Kensington | 7 |
| Menlo Park | 3 |
| Edmond | 1 |
| Nanning | 1 |
| Sacramento | 1 |
| Taipei | 1 |