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dc.contributor.authorKe, W. C.en_US
dc.contributor.authorLee, S. J.en_US
dc.contributor.authorKao, C. Y.en_US
dc.contributor.authorChen, W. K.en_US
dc.contributor.authorChou, W. C.en_US
dc.contributor.authorLee, M. C.en_US
dc.contributor.authorChang, W. H.en_US
dc.contributor.authorLin, W. J.en_US
dc.contributor.authorCheng, Y. C.en_US
dc.contributor.authorLee, T. C.en_US
dc.contributor.authorLin, J. C.en_US
dc.date.accessioned2014-12-08T15:48:05Z-
dc.date.available2014-12-08T15:48:05Z-
dc.date.issued2010-10-15en_US
dc.identifier.issn0022-0248en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.jcrysgro.2010.07.044en_US
dc.identifier.urihttp://hdl.handle.net/11536/32068-
dc.description.abstractHigh density InN/GaN nanodots were grown by pulsed mode (PM) metal-organic chemical vapor deposition (MOCVD). InN nanodots density of up to similar to 5 x 10(10) cm(-2) at a growth temperature of 550 degrees C was achieved. The high diffusion activation energy of 2.65 eV due to high NH(3) flow rate generated more reactive nitrogen adatoms on the growth surface, and is believed to be the main reason for the growth of high density InN nanodots. In addition, an anomalous temperature dependence of the PL peak energy was observed for high density InN nanodots. The high carrier concentration, due to high In vacancy (V(ln)) in the InN nanodots, thermally agitated to the conduction band. As the measurement temperature increased, the increase of Fermi energy resulted in blue-shifted PL peak energy. From the Arrhenius plot of integrated PL intensity, the thermal activation energy for the PM grown InN nanodots was estimated to be E(a)similar to 51 meV, indicating strong localization of carriers in the high density InN nanodots. (C) 2010 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectNanostructuresen_US
dc.subjectMetal-organic chemical vapor depositionen_US
dc.subjectInNen_US
dc.subjectSemiconducting indium compoundsen_US
dc.titleGrowth and optical properties of high-density InN nanodotsen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.jcrysgro.2010.07.044en_US
dc.identifier.journalJOURNAL OF CRYSTAL GROWTHen_US
dc.citation.volume312en_US
dc.citation.issue21en_US
dc.citation.spage3209en_US
dc.citation.epage3213en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000286407100029-
dc.citation.woscount4-
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