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dc.contributor.authorLi, Yimingen_US
dc.contributor.authorHwang, Chih-Hongen_US
dc.contributor.authorYeh, Ta-Chingen_US
dc.date.accessioned2014-12-08T15:48:22Z-
dc.date.available2014-12-08T15:48:22Z-
dc.date.issued2008en_US
dc.identifier.isbn978-1-4244-2071-1en_US
dc.identifier.urihttp://hdl.handle.net/11536/32220-
dc.language.isoen_USen_US
dc.titleAsymmetric Gate Capacitance and High Frequency Characteristic Fluctuations in 16 nm Bulk MOSFETs Due to Random Distribution of Discrete Dopantsen_US
dc.typeArticleen_US
dc.identifier.journal2008 IEEE SILICON NANOELECTRONICS WORKSHOPen_US
dc.citation.spage99en_US
dc.citation.epage100en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000279102800051-
Appears in Collections:Conferences Paper