完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Tzeng, CT | en_US |
dc.contributor.author | Tsuei, KD | en_US |
dc.contributor.author | Lo, WS | en_US |
dc.date.accessioned | 2019-04-03T06:39:21Z | - |
dc.date.available | 2019-04-03T06:39:21Z | - |
dc.date.issued | 1998-09-15 | en_US |
dc.identifier.issn | 1098-0121 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevB.58.6837 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/32391 | - |
dc.description.abstract | The insulating Be2C thin films have been successfully prepared on a Be surface. A low-energy electron diffraction pattern shows that the films have (100) orientation along the surface normal. We have used angle-resolved photoemission to map out the occupied bulk band dispersion along the T-X direction. The band-gap edges at the X point are 6.7 and 11.5 eV below the valence-band maximum, which is located at the Gamma point. These values are in good agreement with theoretical calculations. The unoccupied bulk electronic structure is measured using C Is near-edge x-ray-absorption spectroscopy. The spectrum is similar in shape to the energy-loss spectrum and the calculated p-partial density of states, while the peak positions are different. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Experimental electronic structure of Be2C | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1103/PhysRevB.58.6837 | en_US |
dc.identifier.journal | PHYSICAL REVIEW B | en_US |
dc.citation.volume | 58 | en_US |
dc.citation.issue | 11 | en_US |
dc.citation.spage | 6837 | en_US |
dc.citation.epage | 6843 | en_US |
dc.contributor.department | 光電工程研究所 | zh_TW |
dc.contributor.department | Institute of EO Enginerring | en_US |
dc.identifier.wosnumber | WOS:000076058800037 | en_US |
dc.citation.woscount | 16 | en_US |
顯示於類別: | 期刊論文 |