完整後設資料紀錄
DC 欄位語言
dc.contributor.authorTsai, FYen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:48:43Z-
dc.date.available2014-12-08T15:48:43Z-
dc.date.issued1998-09-01en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/11536/32394-
dc.description.abstractInGaAs/GaAs quantum dots have been grown directly on (111) B GaAs substrates using molecular beam epitaxy. The island growth mode, which causes quantum dot formation, is due to the 2X2 surface reconstruction as the growth temperature is lowered. It is not related to the Stranski-Krastanov growth mechanism because the nominal thickness of InGaAs used is far below the critical thickness and no wetting layer is found. Atomic force microscope images indicate island formation with the growth temperature below 480 degrees C. The photoluminescence (PL) spectra of quantum dots show large peak shifts compared with the reference quantum well of the same nominal thickness of InGaAs. The PL emission from the quantum dots is strong and the peaks are narrow. A linewidth as low as 8.5 meV at 8 K has been measured, indicating excellent quality. (C) 1998 American Institute of Physics. [S0021-8979(98)05017-8].en_US
dc.language.isoen_USen_US
dc.titleInGaAs/GaAs quantum dots on (111)B GaAs substratesen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume84en_US
dc.citation.issue5en_US
dc.citation.spage2624en_US
dc.citation.epage2627en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000075590700036-
dc.citation.woscount21-
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