完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lee, TS | en_US |
dc.contributor.author | Shie, JS | en_US |
dc.date.accessioned | 2014-12-08T15:48:46Z | - |
dc.date.available | 2014-12-08T15:48:46Z | - |
dc.date.issued | 1998-09-01 | en_US |
dc.identifier.issn | 0091-3286 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/32435 | - |
dc.description.abstract | A low-cost imaging system capable of recognizing and counting semiconductor good dice is designed and is proven experimentally to be effective. The system utilizes a commercial scanner with the least modification of its inner optics by a beamsplitter-insertion method. Patterns on specular die surfaces therefore can be grabbed clearly, which results in the marks on defective dice being distinguishable. Also, a mask algorithm is developed to count the good dice on an adhesive tape, according to the gray-level histogram and the converted binary picture of the scanned image. The built-in software associated with the scanner, which is reliable and user-friendly, can also be incorporated into the designated algorithm without paying an additional price for system development, (C) 1998 Society of Photo-Optical Instrumentation Engineers. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | optical counting | en_US |
dc.subject | scanner | en_US |
dc.subject | semiconductor dice | en_US |
dc.title | Efficient chip counting system with a modified scanner | en_US |
dc.type | Article | en_US |
dc.identifier.journal | OPTICAL ENGINEERING | en_US |
dc.citation.volume | 37 | en_US |
dc.citation.issue | 9 | en_US |
dc.citation.spage | 2543 | en_US |
dc.citation.epage | 2549 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000075935400016 | - |
dc.citation.woscount | 0 | - |
顯示於類別: | 期刊論文 |