Evaluation of spatial Green's functions for microstrips: fast Hankel transform algorithm and complex image method

Abstract

The fast Hankel transform (FI-IT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.