1. You are Here：

Full metadata record
DC FieldValueLanguage
dc.contributor.authorWANG, CYen_US
dc.contributor.authorCHANG, HLen_US
dc.contributor.authorJUANG, JYen_US
dc.contributor.authorGOU, YSen_US
dc.contributor.authorUEN, TMen_US
dc.date.accessioned2014-12-08T15:04:50Z-
dc.date.available2014-12-08T15:04:50Z-
dc.date.issued1992-08-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://hdl.handle.net/11536/3345-
dc.description.abstractThe current-voltage characteristics (IVC) of Tl-based superconducting thin films as well as the magnetization of the Tl-based bulk sample were investigated. A crossover similar to the prediction of the vortex-glass to vortex-liquid phase transition in the IVC of Tl-based superconducting thin films was clearly demonstrated. More significantly, striking scaling behavior was found in the IVC which is only sample dependent and is irrelevant to the applied magnetic fields. By comparison to dc magnetization measurements on similar bulk samples, it is found that the phase boundary is not the irreversibility line commonly encountered in the flux-creep scenario.en_US
dc.language.isoen_USen_US
dc.subjectTL-BASED SUPERCONDUCTING THIN FILMen_US
dc.subjectIRREVERSIBILITY LINEen_US
dc.subjectFLUX CREEPen_US
dc.subjectVORTEX-GLASS TO VORTEX-LIQUID TRANSITIONen_US
dc.titleOBSERVATION OF THE VORTEX-GLASS TRANSITION IN THE TL-BASED SUPERCONDUCTING THIN-FILMSen_US
dc.typeArticleen_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERSen_US
dc.citation.volume31en_US
dc.citation.issue8Aen_US
dc.citation.spageL1054en_US
dc.citation.epageL1057en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1992JJ76400019-
dc.citation.woscount6-
Appears in Collections:Articles


Related Contents
Loading...