THE EFFECT OF APPLIED FREQUENCIES AND MULTIPLE FIRING ON THE RESISTANCE OF THICK-FILM RESISTORS

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DC Field	Value	Language
dc.contributor.author	CHIOU, BS	en_US
dc.contributor.author	HSU, WY	en_US
dc.contributor.author	DUH, JG	en_US
dc.date.accessioned	2014-12-08T15:04:53Z	-
dc.date.available	2014-12-08T15:04:53Z	-
dc.date.issued	1992-06-01	en_US
dc.identifier.issn	0148-6411	en_US
dc.identifier.uri	http://hdl.handle.net/11536/3406	-
dc.description.abstract	The resistance and impedance as a function of frequency for Dupont 1600 series thick film resistors are investigated. There exists an abrupt decrease in the resistance around 1 MHz. An equivalent circuit model is proposed to explain the high frequency behavior in the resistor. After multiple times of firing, the resistance is altered and the relative change is related to the intrinsic-resistance in the resistor. It is argued that the resistance variation is associated with the microstructure evolution of the resistor, in which the rearrangement of conducting grains in the glass matrix plays a major role.	en_US
dc.language.iso	en_US	en_US
dc.title	THE EFFECT OF APPLIED FREQUENCIES AND MULTIPLE FIRING ON THE RESISTANCE OF THICK-FILM RESISTORS	en_US
dc.type	Article	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY	en_US
dc.citation.volume	15	en_US
dc.citation.issue	3	en_US
dc.citation.spage	393	en_US
dc.citation.epage	396	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1992JF02900019	-
dc.citation.woscount	7	-
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