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dc.contributor.authorCHANG, TCen_US
dc.contributor.authorWU, CWen_US
dc.contributor.authorCHOU, Cen_US
dc.date.accessioned2014-12-08T15:04:54Z-
dc.date.available2014-12-08T15:04:54Z-
dc.date.issued1992-06-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.31.1940en_US
dc.identifier.urihttp://hdl.handle.net/11536/3410-
dc.description.abstractA precision alignment technique is developed. We combined a moire and a differential amplifier to align two Ronchi rulings with high accuracy. The precision of this technique can reach submicron level if higher spatial frequency of the ruling is used.en_US
dc.language.isoen_USen_US
dc.subjectMOIRE FRINGESen_US
dc.subjectRONCHI RULINGen_US
dc.titleA PRECISION ALIGNMENT WITH MOIRE TECHNIQUE AND DIFFERENTIAL-AMPLIFIERen_US
dc.typeNoteen_US
dc.identifier.doi10.1143/JJAP.31.1940en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERSen_US
dc.citation.volume31en_US
dc.citation.issue6Aen_US
dc.citation.spage1940en_US
dc.citation.epage1941en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:A1992JH48300053-
dc.citation.woscount0-
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