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dc.contributor.authorCHANG, KHen_US
dc.contributor.authorWU, JSen_US
dc.contributor.authorLIU, DGen_US
dc.contributor.authorLIOU, DCen_US
dc.contributor.authorLEE, CPen_US
dc.date.accessioned2014-12-08T15:04:59Z-
dc.date.available2014-12-08T15:04:59Z-
dc.date.issued1992-03-01en_US
dc.identifier.issn0957-4522en_US
dc.identifier.urihttp://dx.doi.org/10.1007/BF00701087en_US
dc.identifier.urihttp://hdl.handle.net/11536/3501-
dc.description.abstractLow-temperature (approximately 600-degrees-C) molecular beam epitaxy (MBE) growth of AlGaAs has been studied. It was found that the quality of AlGaAs grown at low temperatures can be as good as that grown at high temperatures ( > 700-degrees-C) if the source materials and the growth chamber are very clean. The threshold currents of Al0.6Ga0.4As/Al0.15Ga0.85As/Al0.6Ga0.4As double heterostructure (DH) lasers grown at low temperatures and high temperatures are almost the same. The material quality can be further improved with a proper amount of indium doping. Photoluminescence (PL) linewidths of 3.1 meV and 1.7 meV have been measured for In-doped Al0.42Ga0.58As and Al0.18Ga0.82As at 4 K, respectively. They are the narrowest linewidths for the MBE-grown AlGaAs with comparable Al contents at any growth temperature. With a proper amount of In doping, double-barrier resonant tunnelling diodes have also shown improved peak-to-valley current ratios.en_US
dc.language.isoen_USen_US
dc.titleHIGH-QUALITY ALGAAS LAYERS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURESen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/BF00701087en_US
dc.identifier.journalJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICSen_US
dc.citation.volume3en_US
dc.citation.issue1en_US
dc.citation.spage11en_US
dc.citation.epage15en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1992HJ75200003-
dc.citation.woscount2-
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