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dc.contributor.authorCHEN, LHen_US
dc.date.accessioned2014-12-08T15:05:02Z-
dc.date.available2014-12-08T15:05:02Z-
dc.date.issued1992-01-01en_US
dc.identifier.issn0031-3203en_US
dc.identifier.urihttp://dx.doi.org/10.1016/0031-3203(92)90006-5en_US
dc.identifier.urihttp://hdl.handle.net/11536/3571-
dc.description.abstractIn this paper, a new feature detector is proposed to extract both edge and line points existing in a same image. It takes an n X n block as a processing unit and locates feature points through two phases: classification and extraction. In the classification phase, based on some local and global properties of the feature points, each block is classified as homogeneous, a line or an edge block. In the extraction phase, for each line or edge block, according to its block type, the proposed approach takes a corresponding feature extractor to locate all feature points. As the block type is known, the extraction work can be speeded up and the extraction result will be more accurate. Furthermore, since the type of extracted feature point is known, this will make segmentation easier. Experimental results are also given to show the effectiveness of the proposed method.en_US
dc.language.isoen_USen_US
dc.subjectEDGE POINTSen_US
dc.subjectENTROPY-BASED THRESHOLDINGen_US
dc.subjectFEATURE CLASSIFICATIONen_US
dc.subjectFEATURE DETECTIONen_US
dc.subjectLINE POINTSen_US
dc.titleA 2-PHASE AREA-LEVEL LINE EDGE DETECTORen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/0031-3203(92)90006-5en_US
dc.identifier.journalPATTERN RECOGNITIONen_US
dc.citation.volume25en_US
dc.citation.issue1en_US
dc.citation.spage55en_US
dc.citation.epage63en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:A1992GY73600005-
dc.citation.woscount2-
Appears in Collections:Articles