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dc.contributor.authorWU, LKen_US
dc.contributor.authorCHANG, YCen_US
dc.date.accessioned2014-12-08T15:05:08Z-
dc.date.available2014-12-08T15:05:08Z-
dc.date.issued1991-10-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/22.88539en_US
dc.identifier.urihttp://hdl.handle.net/11536/3677-
dc.description.abstractThe dispersion behavior of waveguide-shielded microstrip line is investigated using the finite-difference time-domain method. The result is a frequency-dependent effective dielectric constant. Structures having centered strip are examined to determine the effects of a top cover alone and the effects of two symmetrically placed sidewalls. Structures with off-centered strip are used to investigate the effects of a single sidewall alone and the combined effects of a single sidewall plus the top wall. Differences between the effects of a single sidewall alone and those of the two symmetrically placed sidewalls are identified. In addition, new results on the combined effects of the top wall plus one sidewall, which are important when considering the placement of the outermost elements of a packaged circuit, are also discussed.en_US
dc.language.isoen_USen_US
dc.titleCHARACTERIZATION OF THE SHIELDING EFFECTS ON THE FREQUENCY-DEPENDENT EFFECTIVE DIELECTRIC-CONSTANT OF A WAVE-GUIDE-SHIELDED MICROSTRIP USING THE FINITE-DIFFERENCE TIME-DOMAIN METHODen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/22.88539en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume39en_US
dc.citation.issue10en_US
dc.citation.spage1688en_US
dc.citation.epage1693en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department傳播研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Communication Studiesen_US
dc.identifier.wosnumberWOS:A1991GF46500002-
dc.citation.woscount11-
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