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dc.contributor.authorLOONG, WAen_US
dc.contributor.authorPAN, HTen_US
dc.date.accessioned2014-12-08T15:05:19Z-
dc.date.available2014-12-08T15:05:19Z-
dc.date.issued1991-03-01en_US
dc.identifier.issn0167-9317en_US
dc.identifier.urihttp://hdl.handle.net/11536/3859-
dc.description.abstractWe found that the Dill's parameters of nonlinearly photobleaching materials of p-diazo-N,N-dimethylaniline chloride zinc chloride(DZC) and poly(di-n-hexylsilane) (PDHS) are irregularly dependent on their film thickness, and also their refractive indexes change during exposure. These difficulties make Dill's model inadequate for the simulation of nonlinear photobleaching materials used in contrast enhanced lithography. A direct approach was proposed to solve these difficulties. Equations with four parameters were derived to simulate the bleaching curves of DZC, PDHS and reported bleaching curve of CEM-2. Equations correlated very well with these curves by using best fitted parameters. Linearity was found with parameters in these equations as a function of film thickness of DZC and PDHS. Based on this linearity, simulations of these nonlinear bleaching curves are more accurate than those using Dill's model.en_US
dc.language.isoen_USen_US
dc.titleTHE MODELING AND SIMULATION OF NONLINEAR PHOTOBLEACHING MATERIALSen_US
dc.typeArticleen_US
dc.identifier.journalMICROELECTRONIC ENGINEERINGen_US
dc.citation.volume13en_US
dc.citation.issue1-4en_US
dc.citation.spage493en_US
dc.citation.epage496en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:A1991GA21700105-
dc.citation.woscount1-
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