ON OFF RATIO DEGRADATION OF HIGH-DENSITY WDM SYSTEMS DUE TO RAMAN CROSSTALK

Full metadata record

DC Field	Value	Language
dc.contributor.author	KAO, MS	en_US
dc.date.accessioned	2014-12-08T15:05:32Z	-
dc.date.available	2014-12-08T15:05:32Z	-
dc.date.issued	1990-07-05	en_US
dc.identifier.issn	0013-5194	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4062	-
dc.language.iso	en_US	en_US
dc.title	ON OFF RATIO DEGRADATION OF HIGH-DENSITY WDM SYSTEMS DUE TO RAMAN CROSSTALK	en_US
dc.type	Article	en_US
dc.identifier.journal	ELECTRONICS LETTERS	en_US
dc.citation.volume	26	en_US
dc.citation.issue	14	en_US
dc.citation.spage	1034	en_US
dc.citation.epage	1035	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	電信工程研究所	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Institute of Communications Engineering	en_US
dc.identifier.wosnumber	WOS:A1990DQ06800046	-
dc.citation.woscount	2	-
Appears in Collections:	Articles

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