完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | TSAI, JY | en_US |
dc.contributor.author | TSUI, BY | en_US |
dc.contributor.author | CHEN, MC | en_US |
dc.date.accessioned | 2014-12-08T15:05:36Z | - |
dc.date.available | 2014-12-08T15:05:36Z | - |
dc.date.issued | 1990-04-01 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.345327 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/4143 | - |
dc.language.iso | en_US | en_US |
dc.title | HIGH-TEMPERATURE STABILITY OF PLATINUM SILICIDE ASSOCIATED WITH FLUORINE IMPLANTATION | en_US |
dc.type | Note | en_US |
dc.identifier.doi | 10.1063/1.345327 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 67 | en_US |
dc.citation.issue | 7 | en_US |
dc.citation.spage | 3530 | en_US |
dc.citation.epage | 3533 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1990CV63900052 | - |
dc.citation.woscount | 14 | - |
顯示於類別: | 期刊論文 |