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學術出版;;Publications
期刊論文;;Articles
ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMS
ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMS
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A1990CK60100002.pdf
(1,005.62 KB)
Date
1990-02-01
Authors
HO, JH
LEE, CL
LEI, TF
CHAO, TS
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Journal ISSN
Volume Title
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DOI
10.1364/JOSAA.7.000196
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URI
http://dx.doi.org/10.1364/JOSAA.7.000196
https://ir.lib.nycu.edu.tw/handle/11536/4180
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