Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wu, Chia-Hao | en_US |
dc.contributor.author | Sheu, Jeng-Tzong | en_US |
dc.contributor.author | Chen, Chia Hao | en_US |
dc.contributor.author | Chao, Tieng-Sheng | en_US |
dc.date.accessioned | 2014-12-08T15:05:42Z | - |
dc.date.available | 2014-12-08T15:05:42Z | - |
dc.date.issued | 2007-09-01 | en_US |
dc.identifier.issn | 0021-4922 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1143/JJAP.46.6272 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/4229 | - |
dc.description.abstract | A new approach is introduced for the selective deposition of colloidal gold nanoparticles (AuNPs) onto the surface of unpatterned self-assembled monolayers (SAMs). The patterning of N-(2-aminoethyl)-3-aminopropyltrimethoxysilane (AEAPTMS) SAMs is realized by local field-induced bond breaking using scanning probe lithography (SPL) on a thin SiO2 surface. Different tip/sample biases were investigated to determine the bond breaking efficiency of AEAPTMS SAMs. It was found that bond breaking efficiency was limited by tunneling current through the thin SiO2 film so that both the tip bias and the tip scanning speed play important roles. AuNPs with negatively charged citrate surfaces were selectively anchored onto the unpatterned area via electrostatic force between AEAPTMS SAMs and AuNPs. Single-digit numbers of AuNPs anchored onto unpatterned AEAPTMS SAMs were demonstrated. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | self-assembled monolayer (SAM) | en_US |
dc.subject | gold nanoparticles (AuNPs) | en_US |
dc.subject | N-(2-aminoethyl)-3-aminopropyltrimethoxysilane (AEAPTMS) | en_US |
dc.subject | bond breaking | en_US |
dc.subject | scanning probe lithography (SPL) | en_US |
dc.subject | atomic force microscopy (AFM) | en_US |
dc.title | Scanning probe lithography of self-assembled N-(2-aminoethyl)-3-aminopropyltrimethoxysilane monolayers on SiO2 surface | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1143/JJAP.46.6272 | en_US |
dc.identifier.journal | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | en_US |
dc.citation.volume | 46 | en_US |
dc.citation.issue | 9B | en_US |
dc.citation.spage | 6272 | en_US |
dc.citation.epage | 6276 | en_US |
dc.contributor.department | 材料科學與工程學系奈米科技碩博班 | zh_TW |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Graduate Program of Nanotechnology , Department of Materials Science and Engineering | en_US |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000250066700036 | - |
Appears in Collections: | Conferences Paper |
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