完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | CHIOU, BS | en_US |
dc.contributor.author | LIN, ST | en_US |
dc.contributor.author | DUH, JG | en_US |
dc.date.accessioned | 2014-12-08T15:05:42Z | - |
dc.date.available | 2014-12-08T15:05:42Z | - |
dc.date.issued | 1990-01-01 | en_US |
dc.identifier.issn | 0254-0584 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/4236 | - |
dc.language.iso | en_US | en_US |
dc.title | EPR EVIDENCE FOR COMPENSATING DEFECTS IN BATIO3 GRAIN-BOUNDARY BARRIER LAYER CAPACITORS | en_US |
dc.type | Article | en_US |
dc.identifier.journal | MATERIALS CHEMISTRY AND PHYSICS | en_US |
dc.citation.volume | 24 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 239 | en_US |
dc.citation.epage | 245 | en_US |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1990CG18600002 | - |
dc.citation.woscount | 4 | - |
顯示於類別: | 期刊論文 |