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DC FieldValueLanguage
dc.contributor.authorCHEN, SMen_US
dc.contributor.authorPAN, RPen_US
dc.contributor.authorPAN, CLen_US
dc.date.accessioned2014-12-08T15:05:43Z-
dc.date.available2014-12-08T15:05:43Z-
dc.date.issued1989-12-01en_US
dc.identifier.issn0740-3224en_US
dc.identifier.urihttp://hdl.handle.net/11536/4251-
dc.language.isoen_USen_US
dc.titleINTERFEROMETRIC MEASUREMENTS OF THE THICKNESS OF NEMATIC LIQUID-CRYSTAL FILMS WITH A FREE-SURFACEen_US
dc.typeLetteren_US
dc.identifier.journalAPPLIED OPTICSen_US
dc.citation.volume28en_US
dc.citation.issue23en_US
dc.citation.spage4969en_US
dc.citation.epage4971en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1989CC65800005-
dc.citation.woscount5-
Appears in Collections:Articles


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