COMPOSITIONAL DEPENDENCE OF THERMAL-STABILITY OF REFRACTORY-METAL SILICIDE SCHOTTKY CONTACTS TO GAAS

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	LEE, CP	en_US
dc.contributor.author	LIU, TH	en_US
dc.contributor.author	WU, SC	en_US
dc.date.accessioned	2014-12-08T15:05:46Z	-
dc.date.available	2014-12-08T15:05:46Z	-
dc.date.issued	1989-09-01	en_US
dc.identifier.issn	0361-5235	en_US
dc.identifier.uri	http://dx.doi.org/10.1007/BF02657477	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4302	-
dc.language.iso	en_US	en_US
dc.title	COMPOSITIONAL DEPENDENCE OF THERMAL-STABILITY OF REFRACTORY-METAL SILICIDE SCHOTTKY CONTACTS TO GAAS	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1007/BF02657477	en_US
dc.identifier.journal	JOURNAL OF ELECTRONIC MATERIALS	en_US
dc.citation.volume	18	en_US
dc.citation.issue	5	en_US
dc.citation.spage	623	en_US
dc.citation.epage	626	en_US
dc.contributor.department	奈米中心	zh_TW
dc.contributor.department	Nano Facility Center	en_US
dc.identifier.wosnumber	WOS:A1989AP36100011	-
dc.citation.woscount	1	-
顯示於類別：	期刊論文