REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY

Title:	REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY
Authors:	HO, JH LEE, CL LEI, TF 交大名義發表電控工程研究所 National Chiao Tung University Institute of Electrical and Control Engineering
Issue Date:	3-Aug-1989
URI:	http://hdl.handle.net/11536/4310
ISSN:	0013-5194
Journal:	ELECTRONICS LETTERS
Volume:	25
Issue:	16
Begin Page:	1084
End Page:	1086
Appears in Collections:	Articles

APA	HO, J., LEE, C., & LEI, T. (1989). REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY. WOS:A1989AK81300047.
Bibtex	@article{HO1989REFRACTIVE-INDEX, title={REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY}, author={HO, JH and LEE, CL and LEI, TF}, journal={WOS:A1989AK81300047}, year={1989}, url={https://ir.lib.nycu.edu.tw/handle/11536/4310}, }