標題: REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY
作者: HO, JH
LEE, CL
LEI, TF
交大名義發表
電控工程研究所
National Chiao Tung University
Institute of Electrical and Control Engineering
公開日期: 3-Aug-1989
URI: http://hdl.handle.net/11536/4310
ISSN: 0013-5194
期刊: ELECTRONICS LETTERS
Volume: 25
Issue: 16
起始頁: 1084
結束頁: 1086
Appears in Collections:Articles