標題: | REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY |
作者: | HO, JH LEE, CL LEI, TF 交大名義發表 電控工程研究所 National Chiao Tung University Institute of Electrical and Control Engineering |
公開日期: | 3-八月-1989 |
URI: | http://hdl.handle.net/11536/4310 |
ISSN: | 0013-5194 |
期刊: | ELECTRONICS LETTERS |
Volume: | 25 |
Issue: | 16 |
起始頁: | 1084 |
結束頁: | 1086 |
顯示於類別: | 期刊論文 |