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dc.contributor.author吳家榮en_US
dc.contributor.authorWu, Chia-Jungen_US
dc.contributor.author陳瑞順en_US
dc.contributor.author李永銘en_US
dc.contributor.authorChen, Ruey-Shunen_US
dc.contributor.authorLi, Yung-Mingen_US
dc.date.accessioned2014-12-12T01:35:15Z-
dc.date.available2014-12-12T01:35:15Z-
dc.date.issued2008en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT079664517en_US
dc.identifier.urihttp://hdl.handle.net/11536/43719-
dc.description.abstract本研究設計Web服務軟體元件框架與XML資料結構來蒐集、整合與管理不同製程和設備的元件測試資料,提供一個可擴充、彈性化、標準化、可重複使用的Web Service元件測試軟體平台。運用此一軟體平台建構CMOS影像感測元件多元測試系統,透過此軟體平台提供資料庫與檔案處理服務、XML格式轉換處理服務、基本資料維護服務、Loader測試結果轉換處理服務、生產品質控制服務以及異常事件處理服務,進而得以整合MES系統,使生產流程自動化,提供自動化蒐集測試生產資料及品質異常自動管制生產批機制,解決客製化測試系統及人工蒐集輸入測試資料所產生的問題。zh_TW
dc.description.abstractIn this research, I have designed a Web Service of software component structure and XML data structure to collect, integrate, and manage device test data. It provides an extendable, flexible, standardized and reusable Web Service component test software platform. To use this software platform make a CMOS image sensor multi-test system, then integrate MES system, provide functions of automatic collect test process data, automatic hold and release process lot which has abnormal quality. It provide database and file system handling service, XML data format translate handling service, basic data maintain service, test result translate service, quality of production control service and abnormal event handling service.en_US
dc.language.isozh_TWen_US
dc.subject影像感測元件zh_TW
dc.subject元件測試zh_TW
dc.subject製造執行系統zh_TW
dc.subjectCMOS image sensoren_US
dc.subjectComponent testen_US
dc.subjectMESen_US
dc.title運用Web Service在CMOS影像感測元件測試之研究zh_TW
dc.titleUsing Web Service to Multi-Test in CMOS Image Sensor Componenten_US
dc.typeThesisen_US
dc.contributor.department管理學院資訊管理學程zh_TW
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