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dc.contributor.authorLIN, SSen_US
dc.contributor.authorHUANG, YSen_US
dc.contributor.authorHUANG, CRen_US
dc.contributor.authorLEE, MCen_US
dc.date.accessioned2014-12-08T15:05:52Z-
dc.date.available2014-12-08T15:05:52Z-
dc.date.issued1989-02-01en_US
dc.identifier.issn0038-1098en_US
dc.identifier.urihttp://hdl.handle.net/11536/4401-
dc.language.isoen_USen_US
dc.titleRAMAN INVESTIGATION OF RUS2en_US
dc.typeArticleen_US
dc.identifier.journalSOLID STATE COMMUNICATIONSen_US
dc.citation.volume69en_US
dc.citation.issue6en_US
dc.citation.spage589en_US
dc.citation.epage593en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1989T239200001-
dc.citation.woscount10-
顯示於類別:期刊論文