A NEW METHOD FOR DETERMINING THE TERMINAL SERIES RESISTANCES AND HIGH-INJECTION COEFFICIENT OF BIPOLAR-TRANSISTORS IN CMOS INTEGRATED-CIRCUITS FOR COMPUTER-AIDED CIRCUIT MODELING

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	YANG, YH	en_US
dc.contributor.author	WU, CY	en_US
dc.contributor.author	CHEN, WY	en_US
dc.date.accessioned	2014-12-08T15:06:00Z	-
dc.date.available	2014-12-08T15:06:00Z	-
dc.date.issued	1988-05-01	en_US
dc.identifier.issn	0038-1101	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4537	-
dc.language.iso	en_US	en_US
dc.title	A NEW METHOD FOR DETERMINING THE TERMINAL SERIES RESISTANCES AND HIGH-INJECTION COEFFICIENT OF BIPOLAR-TRANSISTORS IN CMOS INTEGRATED-CIRCUITS FOR COMPUTER-AIDED CIRCUIT MODELING	en_US
dc.type	Article	en_US
dc.identifier.journal	SOLID-STATE ELECTRONICS	en_US
dc.citation.volume	31	en_US
dc.citation.issue	5	en_US
dc.citation.spage	929	en_US
dc.citation.epage	936	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1988N204100014	-
dc.citation.woscount	0	-
顯示於類別：	期刊論文