SYSTEM RELIABILITY-DESIGN WITH DETERIORATIVE COMPONENTS

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	JAN, RH	en_US
dc.contributor.author	CHERN, MS	en_US
dc.date.accessioned	2014-12-08T15:06:01Z	-
dc.date.available	2014-12-08T15:06:01Z	-
dc.date.issued	1988	en_US
dc.identifier.issn	0026-2714	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4581	-
dc.language.iso	en_US	en_US
dc.title	SYSTEM RELIABILITY-DESIGN WITH DETERIORATIVE COMPONENTS	en_US
dc.type	Article	en_US
dc.identifier.journal	MICROELECTRONICS AND RELIABILITY	en_US
dc.citation.volume	28	en_US
dc.citation.issue	1	en_US
dc.citation.spage	43	en_US
dc.citation.epage	58	en_US
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:A1988L467700008	-
dc.citation.woscount	0	-
顯示於類別：	期刊論文