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DC FieldValueLanguage
dc.contributor.authorJAN, RHen_US
dc.contributor.authorCHERN, MSen_US
dc.date.accessioned2014-12-08T15:06:01Z-
dc.date.available2014-12-08T15:06:01Z-
dc.date.issued1988en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://hdl.handle.net/11536/4581-
dc.language.isoen_USen_US
dc.titleSYSTEM RELIABILITY-DESIGN WITH DETERIORATIVE COMPONENTSen_US
dc.typeArticleen_US
dc.identifier.journalMICROELECTRONICS AND RELIABILITYen_US
dc.citation.volume28en_US
dc.citation.issue1en_US
dc.citation.spage43en_US
dc.citation.epage58en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:A1988L467700008-
dc.citation.woscount0-
Appears in Collections:Articles


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