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dc.contributor.authorKo, Fu-Hsiangen_US
dc.contributor.authorHsu, Yi-Chiehen_US
dc.contributor.authorWang, Menq-Teen_US
dc.contributor.authorHuang, Gue-wha Stevenen_US
dc.date.accessioned2014-12-08T15:06:04Z-
dc.date.available2014-12-08T15:06:04Z-
dc.date.issued2007-05-01en_US
dc.identifier.issn0167-9317en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.mee.2007.01.069en_US
dc.identifier.urihttp://hdl.handle.net/11536/4641-
dc.description.abstractIn this article, we use the piezoelectric material of PbZrxTi(1-x)O3 (PZT) to fabricate a thin film by sol-gel technique. The novel hydrothermal annealing under microwave system substitutes the conventional furnace annealing. The films from various reaction conditions are analyzed by scanning electron microscope and X-ray diffraction. In addition, the PZT film is used to fabricate the gas sensor. The resonant frequency of the developed PZT sensor is about 30 MHz and the sensing limit for organic vapour is estimated to be about 1 ppm. (c) 2007 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectsol-gelen_US
dc.subjectmicrowave-assisted annealingen_US
dc.subjectgas sensoren_US
dc.subjectpiezoelectric PZT filmen_US
dc.titleFabrication of a gas sensor with a piezoelectric PZT film deposited by a novel hydrothermal microwave-assisted annealingen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.mee.2007.01.069en_US
dc.identifier.journalMICROELECTRONIC ENGINEERINGen_US
dc.citation.volume84en_US
dc.citation.issue5-8en_US
dc.citation.spage1300en_US
dc.citation.epage1304en_US
dc.contributor.department材料科學與工程學系奈米科技碩博班zh_TW
dc.contributor.departmentGraduate Program of Nanotechnology , Department of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000247182500143-
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